This document presents the frequency stability test results for LTE Band 12, as detailed in Annex A.4 of the test report. The tests were conducted to assess the device's ability to maintain a stable frequency under varying voltage and temperature conditions. The report includes comprehensive data on frequency deviations in Hertz (Hz) and parts per million (ppm), along with pass/fail verdicts based on predefined limits.
The tests involved modulating the signal using QPSK and evaluating the frequency stability across different channels and RB configurations. Voltage variations included normal voltage (VN), low voltage (VL), and high voltage (VH). Temperature variations ranged from -30°C to +50°C. The results demonstrate the device's compliance with frequency stability requirements under diverse operating conditions.
The data presented in this report is crucial for verifying the reliability and performance of the device in real-world scenarios, ensuring that it operates within specified frequency tolerances. The detailed measurements and analysis provide valuable insights into the device's frequency stability characteristics.
Array
(
[0] => Array
(
[url_sha] => 18856a2da463148bf59a6c352c422f5cf9ad3998f71803d38b9e6d483fe8489c
[source] => fccid
[url] => https://apps.fcc.gov/eas/GetApplicationAttachment.html?id=8261875
[href_text] => RF test report appendix A.4 part2
[href_description] => Eagle Electronics Inc. I4915QAFA LTE Cat1 bis Module 2BNX7I4915QAFA 2BNX7I4915QAFA i4915qafa
[http_status] => 200
[http_lastmod] => 0000-00-00 00:00:00
[http_contenttype] =>
[http_filename] => GetApplicationAttachment.html?id=8261875
[http_size] => 3437956
[file_sha256] => cfee117abedebd52e6f3c487ae76a458a5249423e356ae7a52e1562ae040425c
[domain] => document.fccid
)
)
Array
(
[file_sha256] => cfee117abedebd52e6f3c487ae76a458a5249423e356ae7a52e1562ae040425c
[cleanFccId] => 2BNX7I4915QAFA
[title] => LTE Band 12 Frequency Stability Test Report - Annex A.4
[description] => Frequency stability test results for LTE Band 12, including voltage and temperature variations. Detailed data and pass/fail verdicts included.
[brand_name] => PVT
[keywords] => ["LTE Band 12", "Frequency Stability", "PD20250040-R3A", "QPSK", "23095", "23060", "23130", "23155", "23035", "23165"]
[intro] =>
This document presents the frequency stability test results for LTE Band 12, as detailed in Annex A.4 of the test report. The tests were conducted to assess the device's ability to maintain a stable frequency under varying voltage and temperature conditions. The report includes comprehensive data on frequency deviations in Hertz (Hz) and parts per million (ppm), along with pass/fail verdicts based on predefined limits.
The tests involved modulating the signal using QPSK and evaluating the frequency stability across different channels and RB configurations. Voltage variations included normal voltage (VN), low voltage (VL), and high voltage (VH). Temperature variations ranged from -30°C to +50°C. The results demonstrate the device's compliance with frequency stability requirements under diverse operating conditions.
The data presented in this report is crucial for verifying the reliability and performance of the device in real-world scenarios, ensuring that it operates within specified frequency tolerances. The detailed measurements and analysis provide valuable insights into the device's frequency stability characteristics.
)
Array
(
[0] => Array
(
[id] => 8261875
[file_sha256] =>
[applicationId] => DUbtCC7jJmMaMzBb2vf2dA==
[description] => RF test report appendix A.4 part2
[shortTermConfidential] => No
[permanentConfidential] => No
[supercede] => No
[exhibitType] => Test Report
[fileType] => Adobe Acrobat PDF
[displayType] => pdf
[fileSize] => 3437958
[submissionDate] => 2025-05-05 00:00:00
[dateAvailable] => 2025-05-05 00:00:00
[creationDate] =>
[producer] =>
[modDate] =>
[title] =>
[creator] =>
[author] =>
[pages] =>
[realSize] =>
[html] => 0
[png] => 0
[txt] => 0
[version] => 1
[source] => 0
[fccId] => 2BNX7I4915QAFA
[cleanFccId] => 2BNX7I4915QAFA
[exif] => 0
)
)