Anbotek LTE-B66 Appendix Test Data: Conducted Spurious Emission

FCC-LTE-B66 Appendix Test Data_1-80

This document presents the appendix test data for LTE-B66, focusing on conducted spurious emissions. The tests were conducted by Shenzhen Anbotek Compliance Laboratory Limited, ensuring product safety and regulatory compliance.

The report includes detailed test results for various bandwidths, modulations, and channel configurations. Key parameters such as frequency range, result (dBm), and verdict are provided for each test case. The tests were performed under controlled environmental conditions, with a temperature of 24.3°C and relative humidity of 57%.

The test setup and procedures adhere to industry standards, ensuring the reliability and accuracy of the data. The results demonstrate the device's performance in terms of conducted spurious emissions, confirming its compliance with regulatory limits.

This comprehensive report serves as a valuable resource for understanding the device's emission characteristics and verifying its suitability for deployment in various environments.


File Info : application/pdf, 80 Pages, 5.27MB

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Anbotek: LTE-B66, 1814C50039512501, FCC, Conducted Spurious Emission, Appendix Test Data