This document presents the detailed test data for LTE Band 25, specifically focusing on conducted spurious emission measurements. It serves as Appendix I, part 2, to the complete test report. The data includes measurements taken across various bandwidths (1.4MHz, 3MHz, 5MHz, 10MHz, 15MHz, and 20MHz), modulation schemes (QPSK and 16QAM), and channel configurations.
The measurements were performed to ensure compliance with regulatory limits for spurious emissions. The results are presented in tabular format, showing the frequency range, measured result in dBm, and verdict (PASS/FAIL). The test setup and procedures followed are in accordance with industry standards. The document also includes spectrum analyzer plots illustrating the emission levels across different frequency ranges.
The equipment used for testing includes an Agilent Spectrum Analyzer, and the test parameters are carefully controlled to ensure accurate and reliable results. The data presented in this appendix provides a comprehensive overview of the conducted spurious emission performance of the device under test.
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This document presents the detailed test data for LTE Band 25, specifically focusing on conducted spurious emission measurements. It serves as Appendix I, part 2, to the complete test report. The data includes measurements taken across various bandwidths (1.4MHz, 3MHz, 5MHz, 10MHz, 15MHz, and 20MHz), modulation schemes (QPSK and 16QAM), and channel configurations.
The measurements were performed to ensure compliance with regulatory limits for spurious emissions. The results are presented in tabular format, showing the frequency range, measured result in dBm, and verdict (PASS/FAIL). The test setup and procedures followed are in accordance with industry standards. The document also includes spectrum analyzer plots illustrating the emission levels across different frequency ranges.
The equipment used for testing includes an Agilent Spectrum Analyzer, and the test parameters are carefully controlled to ensure accurate and reliable results. The data presented in this appendix provides a comprehensive overview of the conducted spurious emission performance of the device under test.
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