This document presents a detailed test report on the spurious emissions of an LTE device, specifically models 37825 and 38075. The tests were conducted by JianYan Testing Group Shenzhen Co., Ltd., and the report is identified by the number JYTSZ-R12-2401466. The primary objective of these tests is to ensure compliance with regulatory standards, particularly part 46, regarding the emission of unwanted signals outside the authorized frequency band.
The report includes a series of spectrum analyzer plots, each representing a different configuration of the LTE device. These configurations vary in terms of bandwidth (15MHz), modulation scheme (QPSK, 16QAM), and resource block allocation. Each plot displays the measured signal strength across a wide frequency range, from 30 MHz to 27 GHz, allowing for a comprehensive assessment of spurious emissions. The plots are annotated with key parameters such as center frequency, resolution bandwidth, and sweep time. The results indicate whether the device passes the specified emission limits for each configuration.
The test setup and procedures are designed to accurately capture and analyze the spurious emissions generated by the LTE device. The data presented in this report provides valuable insights into the device's emission characteristics and its compliance with regulatory requirements.
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[description] => Comprehensive LTE spurious emissions test report, compliant with part 46, covering models 37825-38075. Detailed analysis and results included.
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This document presents a detailed test report on the spurious emissions of an LTE device, specifically models 37825 and 38075. The tests were conducted by JianYan Testing Group Shenzhen Co., Ltd., and the report is identified by the number JYTSZ-R12-2401466. The primary objective of these tests is to ensure compliance with regulatory standards, particularly part 46, regarding the emission of unwanted signals outside the authorized frequency band.
The report includes a series of spectrum analyzer plots, each representing a different configuration of the LTE device. These configurations vary in terms of bandwidth (15MHz), modulation scheme (QPSK, 16QAM), and resource block allocation. Each plot displays the measured signal strength across a wide frequency range, from 30 MHz to 27 GHz, allowing for a comprehensive assessment of spurious emissions. The plots are annotated with key parameters such as center frequency, resolution bandwidth, and sweep time. The results indicate whether the device passes the specified emission limits for each configuration.
The test setup and procedures are designed to accurately capture and analyze the spurious emissions generated by the LTE device. The data presented in this report provides valuable insights into the device's emission characteristics and its compliance with regulatory requirements.
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