This document presents a visual overview of the test setups used for radiation emission testing. The photographs illustrate the configurations employed to assess the electromagnetic compatibility (EMC) of the device under test (DUT) across different frequency bands. These setups are crucial for ensuring that the DUT complies with relevant regulatory standards and does not emit excessive electromagnetic radiation that could interfere with other electronic devices.
The document includes images of the test setups for radiation emission testing below 30MHz, from 30MHz to 1GHz, and from 1GHz to 18GHz. Each photograph provides a clear view of the DUT's placement, the antenna's position, and the overall arrangement of the testing environment. These visual aids are essential for understanding the testing methodology and verifying the accuracy of the test results. The Waltek Testing Group conducted these tests in Shenzhen, China.
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This document presents a visual overview of the test setups used for radiation emission testing. The photographs illustrate the configurations employed to assess the electromagnetic compatibility (EMC) of the device under test (DUT) across different frequency bands. These setups are crucial for ensuring that the DUT complies with relevant regulatory standards and does not emit excessive electromagnetic radiation that could interfere with other electronic devices.
The document includes images of the test setups for radiation emission testing below 30MHz, from 30MHz to 1GHz, and from 1GHz to 18GHz. Each photograph provides a clear view of the DUT's placement, the antenna's position, and the overall arrangement of the testing environment. These visual aids are essential for understanding the testing methodology and verifying the accuracy of the test results. The Waltek Testing Group conducted these tests in Shenzhen, China.
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