This document presents the frequency stability test results for devices operating in LTE Band 66. The tests were conducted under various conditions of voltage and temperature to ensure compliance with regulatory requirements. The report includes detailed measurements of frequency deviation, limit values, and verdict for each test configuration.
The tests were performed using QPSK modulation with different resource block (RB) configurations, including single resource block (1RB) and full resource block (100RB). The voltage was varied from low voltage (VL) to high voltage (VH), and the temperature was varied from -30°C to +50°C. The frequency deviation was measured in Hertz (Hz) and parts per million (ppm), and the results were compared to the specified limit values.
The report provides a comprehensive overview of the frequency stability performance of the tested devices, demonstrating their ability to maintain stable operation under a wide range of environmental conditions. The results confirm that the devices meet the required frequency stability standards for LTE Band 66 operation.
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The tests were performed using QPSK modulation with different resource block (RB) configurations, including single resource block (1RB) and full resource block (100RB). The voltage was varied from low voltage (VL) to high voltage (VH), and the temperature was varied from -30°C to +50°C. The frequency deviation was measured in Hertz (Hz) and parts per million (ppm), and the results were compared to the specified limit values.
The report provides a comprehensive overview of the frequency stability performance of the tested devices, demonstrating their ability to maintain stable operation under a wide range of environmental conditions. The results confirm that the devices meet the required frequency stability standards for LTE Band 66 operation.
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