SAR Test Report
tags: Array
(
[0] => Array
(
[url_sha] => aeeab3e4c571d0c8dac2a643d1106368442d87634946624b12e5b2d92b53c737
[source] => fccid
[url] => https://apps.fcc.gov/eas/GetApplicationAttachment.html?id=6421351
[href_text] => SAR Test Report
[href_description] => Corsair Memory, Inc. RDA0048 2AAFMRDA0048 2AAFMRDA0048 rda0048
[http_status] => 200
[http_lastmod] => 0000-00-00 00:00:00
[http_contenttype] => application/pdf
[http_filename] => GetApplicationAttachment.html?id=6421351
[http_size] => 1921530
[file_sha256] => 40f73e1a1f5c9348233f711eb3da567504c1bf6711a97e959e40ea723e225fa6
[domain] => document.fccid
)
)
Array
(
[0] => Array
(
[id] => 6421351
[file_sha256] =>
[applicationId] => 03ZZCKGLvi9t89rwFLw5sA==
[description] => SAR Test Report
[shortTermConfidential] => No
[permanentConfidential] => No
[supercede] => No
[exhibitType] => RF Exposure Info
[fileType] => Adobe Acrobat PDF
[displayType] => pdf
[fileSize] => 1921531
[submissionDate] => 2023-03-17 00:00:00
[dateAvailable] => 2023-03-17 00:00:00
[creationDate] =>
[producer] =>
[modDate] =>
[title] =>
[creator] =>
[author] =>
[pages] =>
[realSize] =>
[html] => 0
[png] => 0
[txt] => 0
[version] => 0
[source] => 0
[fccId] => 2AAFMRDA0048
[cleanFccId] => 2AAFMRDA0048
[exif] => 0
)
)