This document presents the frequency stability test results for LTE Band 2, as per the report PD20250027-R3A. The tests were conducted under various conditions to ensure compliance with regulatory requirements. The report includes detailed data for different modulation schemes, including QPSK, and various Resource Block (RB) configurations. The tests cover a wide range of temperature variations, from -30°C to +50°C, and voltage variations to simulate real-world operating conditions.
The frequency stability is evaluated by measuring the frequency deviation in Hertz (Hz) and parts per million (ppm). The results are compared against predefined limits to determine compliance. The report includes data for multiple channels, such as 18615, 18900, 19185, 18625, 18650, 18675, 19125, 18700, and 19100, ensuring comprehensive coverage of the LTE Band 2 spectrum. The test results indicate whether the device passes or fails the frequency stability requirements under each tested condition, providing a clear assessment of the device's performance.
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This document presents the frequency stability test results for LTE Band 2, as per the report PD20250027-R3A. The tests were conducted under various conditions to ensure compliance with regulatory requirements. The report includes detailed data for different modulation schemes, including QPSK, and various Resource Block (RB) configurations. The tests cover a wide range of temperature variations, from -30°C to +50°C, and voltage variations to simulate real-world operating conditions.
The frequency stability is evaluated by measuring the frequency deviation in Hertz (Hz) and parts per million (ppm). The results are compared against predefined limits to determine compliance. The report includes data for multiple channels, such as 18615, 18900, 19185, 18625, 18650, 18675, 19125, 18700, and 19100, ensuring comprehensive coverage of the LTE Band 2 spectrum. The test results indicate whether the device passes or fails the frequency stability requirements under each tested condition, providing a clear assessment of the device's performance.
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