BACL Test Report: Conducted Output Power and Bandwidth

Test Report Appendix

This document presents a detailed test report from Bay Area Compliance Labs Corp. (BACL), focusing on the conducted output power, emission bandwidth, and occupied bandwidth characteristics of a device identified as sample number 2T2R-3. The tests were conducted in a controlled RF environment by Rainbow Zhu, with temperature and humidity carefully monitored. The report covers various operating modes, including 802.11a, 802.11ac20/40/80, and 802.11ax20/40/80, across the 5150-5250MHz and 5725-5850MHz frequency bands.

The report includes measurements of average output power, 26dB emission bandwidth, 6dB emission bandwidth, and 99% occupied bandwidth. Power spectral density measurements are also provided. Duty cycle measurements are included to account for the transmission characteristics of the device. The test results are compared against specified limits, and the verdict (Pass/Fail) is clearly indicated for each test configuration. Detailed plots are included to visualize the test data and provide a comprehensive understanding of the device's performance.


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tags: ["2T2R-3", "802.11a", "802.11ac20", "802.11ac40", "802.11ac80", "802.11ax20", "802.11ax40", "802.11ax80"]
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This document presents a detailed test report from Bay Area Compliance Labs Corp. (BACL), focusing on the conducted output power, emission bandwidth, and occupied bandwidth characteristics of a device identified as sample number 2T2R-3. The tests were conducted in a controlled RF environment by Rainbow Zhu, with temperature and humidity carefully monitored. The report covers various operating modes, including 802.11a, 802.11ac20/40/80, and 802.11ax20/40/80, across the 5150-5250MHz and 5725-5850MHz frequency bands.

The report includes measurements of average output power, 26dB emission bandwidth, 6dB emission bandwidth, and 99% occupied bandwidth. Power spectral density measurements are also provided. Duty cycle measurements are included to account for the transmission characteristics of the device. The test results are compared against specified limits, and the verdict (Pass/Fail) is clearly indicated for each test configuration. Detailed plots are included to visualize the test data and provide a comprehensive understanding of the device's performance.

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