This document presents a comprehensive test report detailing the conducted spurious emission measurements for LTE Band 66. The report includes detailed test results, graphs, and analysis to ensure compliance with regulatory standards. The testing covers various bandwidths (1.4MHz, 3MHz, 5MHz, 10MHz, 15MHz, and 20MHz) and modulation schemes (QPSK and 16QAM) to provide a thorough evaluation of the device's performance.
The report includes detailed graphs and tables showing the spurious emission levels at different frequency ranges. The test setup and methodology are clearly described to ensure the accuracy and reliability of the results. The report also includes a summary of the findings and a conclusion on whether the device meets the required specifications.
This document is intended for regulatory bodies, device manufacturers, and other stakeholders who need to verify the compliance of LTE Band 66 devices with relevant standards. The report provides a valuable resource for understanding the device's emission characteristics and ensuring its safe and reliable operation.
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This document presents a comprehensive test report detailing the conducted spurious emission measurements for LTE Band 66. The report includes detailed test results, graphs, and analysis to ensure compliance with regulatory standards. The testing covers various bandwidths (1.4MHz, 3MHz, 5MHz, 10MHz, 15MHz, and 20MHz) and modulation schemes (QPSK and 16QAM) to provide a thorough evaluation of the device's performance.
The report includes detailed graphs and tables showing the spurious emission levels at different frequency ranges. The test setup and methodology are clearly described to ensure the accuracy and reliability of the results. The report also includes a summary of the findings and a conclusion on whether the device meets the required specifications.
This document is intended for regulatory bodies, device manufacturers, and other stakeholders who need to verify the compliance of LTE Band 66 devices with relevant standards. The report provides a valuable resource for understanding the device's emission characteristics and ensuring its safe and reliable operation.
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