TCWA25010004602: Occupied Bandwidth Test Report

Test Report30

This document presents the Occupied Bandwidth test report with report number TCWA25010004602. The report details the testing procedures and results for a wireless device, focusing on the occupied bandwidth parameter. The tests were conducted by TOWE Wireless Testing(Shenzhen) Co., Ltd.

The report includes spectrum analyzer plots illustrating the occupied bandwidth for various configurations and modulations. The configurations tested include different models such as n41, PC2, and various combinations of 30-25, 30-30, 30-35, and 30-40. Modulation schemes such as DFT-16QAM, DFT-64QAM, DFT-256QAM, CP-QPSK, CP-16QAM, CP-64QAM, CP-256QAM, DFT-BPSK, DFT-QPSK, DFT-16QAM, DFT-64QAM, DFT-256QAM, CP-QPSK, CP-16QAM, CP-64QAM, and CP-256QAM were tested under the Outer_Full-Ant1 condition.

Each test result is accompanied by key parameters such as Transmit Freq Error, x dB Bandwidth, OBW Power, and pass/fail status. The spectrum analyzer plots provide a visual representation of the occupied bandwidth, allowing for a detailed analysis of the device's performance. All tests passed, indicating that the device meets the required occupied bandwidth specifications.

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TOWE: TCWA25010004602, n41, PC2, 30-25, 30-30, 30-35, 30-40, M-DFT-16QAM, M-DFT-64QAM, M-DFT-256QAM, M-CP-QPSK, M-CP-16QAM, M-CP-64QAM, M-CP-256QAM, H-DFT-BPSK, H-DFT-QPSK, H-DFT-16QAM, H-DFT-64QAM, H-DFT-256QAM, H-CP-QPSK, H-CP-16QAM, H-CP-64QAM, H-CP-256QAM, L-DFT-BPSK, L-DFT-QPSK, L-DFT-16QAM, L-DFT-64QAM, L-DFT-256QAM, L-CP-QPSK, L-CP-16QAM, L-CP-64QAM, L-CP-256QAM, Outer_Full-Ant1