This document presents a comprehensive spurious emission test report for devices operating in the N66 frequency band. The tests were conducted by TCT, a certified testing center, and the report is identified by the number TCT250305E032.
The report details the test setup, including the use of Single-Input Single-Output (SISO) configurations and Cyclic Prefix Orthogonal Frequency Division Multiplexing (CP-OFDM). Various modulation schemes were employed, such as Quadrature Phase-Shift Keying (QPSK), 16-Quadrature Amplitude Modulation (16 QAM), 64 QAM, and 256 QAM. Additionally, Discrete Fourier Transform-Spread OFDM (DFT-S-OFDM) was utilized.
The tests covered a range of bandwidths, including 5MHz, 10MHz, 15MHz, and 20MHz, with subcarrier spacings of 15kHz and 30kHz. Specific frequencies tested include 1712.5MHz, 1715MHz, 1717.5MHz, 1720MHz, 1745MHz, 1770MHz, 1772.5MHz, and 1775MHz. The report provides detailed spurious emission measurements and analysis for each configuration, ensuring compliance with regulatory limits.
Array
(
[0] => Array
(
[url_sha] => 98d567ee0ced5709b0cf03d8e47f73dbd8df09050cf2cd77e8e48b29e4cbe1b1
[source] => fccid
[url] => https://apps.fcc.gov/eas/GetApplicationAttachment.html?id=8255803
[href_text] => N66_SA_band_n66_Part 2
[href_description] => FOXX Development Inc. S67L Smart Phone 2AQRM-S67L 2AQRMS67L s67l
[http_status] => 200
[http_lastmod] => 0000-00-00 00:00:00
[http_contenttype] =>
[http_filename] => GetApplicationAttachment.html?id=8255803
[http_size] => 4534938
[file_sha256] => 04a388bff0299abab81db6274dab2212075d20e57128deb7c571410907ce3247
[domain] => document.fccid
)
)
Array
(
[file_sha256] => 04a388bff0299abab81db6274dab2212075d20e57128deb7c571410907ce3247
[cleanFccId] => 2AQRMS67L
[title] => TCT Spurious Emission Test Report for N66 Band Devices
[description] => Detailed spurious emission test results for N66 band devices. Includes SISO and CP-OFDM configurations, various modulations, and bandwidths.
[brand_name] => TCT
[keywords] => ["N66", "SISO", "CP-OFDM", "QPSK", "16 QAM", "64 QAM", "256 QAM", "DFT-S-OFDM", "15kHz", "30kHz", "5MHz", "10MHz", "15MHz", "20MHz", "1712.5MHz", "1715MHz", "1717.5MHz", "1720MHz", "1745MHz", "1770MHz", "1772.5MHz", "1775MHz", "TCT250305E032"]
[intro] =>
This document presents a comprehensive spurious emission test report for devices operating in the N66 frequency band. The tests were conducted by TCT, a certified testing center, and the report is identified by the number TCT250305E032.
The report details the test setup, including the use of Single-Input Single-Output (SISO) configurations and Cyclic Prefix Orthogonal Frequency Division Multiplexing (CP-OFDM). Various modulation schemes were employed, such as Quadrature Phase-Shift Keying (QPSK), 16-Quadrature Amplitude Modulation (16 QAM), 64 QAM, and 256 QAM. Additionally, Discrete Fourier Transform-Spread OFDM (DFT-S-OFDM) was utilized.
The tests covered a range of bandwidths, including 5MHz, 10MHz, 15MHz, and 20MHz, with subcarrier spacings of 15kHz and 30kHz. Specific frequencies tested include 1712.5MHz, 1715MHz, 1717.5MHz, 1720MHz, 1745MHz, 1770MHz, 1772.5MHz, and 1775MHz. The report provides detailed spurious emission measurements and analysis for each configuration, ensuring compliance with regulatory limits.
)
Array
(
[0] => Array
(
[id] => 8255803
[file_sha256] =>
[applicationId] => 85uqgQl7pg1i7dGZxpatpA==
[description] => N66_SA_band_n66_Part 2
[shortTermConfidential] => No
[permanentConfidential] => No
[supercede] => No
[exhibitType] => Test Report
[fileType] => Adobe Acrobat PDF
[displayType] => pdf
[fileSize] => 4534940
[submissionDate] => 2025-04-30 00:00:00
[dateAvailable] => 2025-04-30 00:00:00
[creationDate] =>
[producer] =>
[modDate] =>
[title] =>
[creator] =>
[author] =>
[pages] =>
[realSize] =>
[html] => 0
[png] => 0
[txt] => 0
[version] => 1
[source] => 0
[fccId] => 2AQRM-S67L
[cleanFccId] => 2AQRMS67L
[exif] => 0
)
)