This document presents the frequency stability test results for devices operating on LTE Band 66, as per the report PD20250070-R3A. The tests were conducted under various temperature and voltage conditions to ensure compliance with regulatory standards. The report includes detailed measurements and analysis of frequency deviations under different operational scenarios.
The tests were performed using QPSK modulation with varying bandwidths (3MHz, 5MHz, 10MHz, 15MHz, and 20MHz) and different resource block configurations (1RB#0, 1RB#14, 1RB#24, 1RB#49, 1RB#74, 1RB#99). The devices were subjected to temperature variations ranging from -30°C to +50°C, and voltage variations were applied to simulate real-world operating conditions. The frequency deviations were measured in Hertz (Hz) and parts per million (ppm), and compared against specified limits to verify compliance.
The results indicate that the devices meet the required frequency stability criteria under all tested conditions, ensuring reliable performance within the LTE Band 66 spectrum. Detailed data and graphical representations are provided to support the findings.