RF Exposure Test Report
iText? 5.5.10 ?2000-2015 iText Group NV (AGPL-version); modified using iText? 5.5.10 ?2000-2015 iText Group NV (AGPL-version)
tags: Array
(
[0] => Array
(
[url_sha] => 941724318c9d08cd8a3c1fba856051700c63146863d8889fd2133b937cc61246
[source] => fccid
[url] => https://apps.fcc.gov/eas/GetApplicationAttachment.html?id=7558434
[href_text] => RF Exposure Test Report
[href_description] => Shenzhen Baseus Technology Co., Ltd. S0SW00 2A482-S0SW00 2A482S0SW00 s0sw00
[http_status] => 200
[http_lastmod] => 0000-00-00 00:00:00
[http_contenttype] => application/pdf
[http_filename] => GetApplicationAttachment.html?id=7558434
[http_size] => 1578276
[file_sha256] => db4be67f5b129d63e4c4a21f2643a24f0d831b06e19842bf5fc06f2728ed88c9
[domain] => document.fccid
)
)
Array
(
[0] => Array
(
[id] => 7558434
[file_sha256] =>
[applicationId] => xxcpWIhKSr1TuR/hdZvK3w==
[description] => RF Exposure Test Report
[shortTermConfidential] => No
[permanentConfidential] => No
[supercede] => No
[exhibitType] => RF Exposure Info
[fileType] => Adobe Acrobat PDF
[displayType] => pdf
[fileSize] => 1578277
[submissionDate] => 2024-08-12 00:00:00
[dateAvailable] => 2024-08-12 00:00:00
[creationDate] =>
[producer] =>
[modDate] =>
[title] =>
[creator] =>
[author] =>
[pages] =>
[realSize] =>
[html] => 0
[png] => 0
[txt] => 0
[version] => 0
[source] => 0
[fccId] => 2A482-S0SW00
[cleanFccId] => 2A482S0SW00
[exif] => 0
)
)