This document presents the results of out-of-band emissions testing conducted by Waltek Testing Group (Shenzhen) Co., Ltd. on the NTNV-N78-3450-3550 wireless device. The tests were performed to ensure compliance with relevant regulatory standards for radio frequency emissions.
The testing methodology involved measuring the power levels of emissions outside the designated operating frequency bands of the device. Spectrum analyzer plots are included, showing the emission levels across various frequency ranges. The results demonstrate that the NTNV-N78-3450-3550 device meets the required emission limits, indicating its suitability for certification and commercial use.
Detailed test configurations, including modulation schemes (DFT-QPSK), bandwidths, and antenna ports, are documented within the report. The testing was conducted under controlled laboratory conditions to ensure accuracy and repeatability. The data presented provides a comprehensive assessment of the device's out-of-band emission characteristics.
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This document presents the results of out-of-band emissions testing conducted by Waltek Testing Group (Shenzhen) Co., Ltd. on the NTNV-N78-3450-3550 wireless device. The tests were performed to ensure compliance with relevant regulatory standards for radio frequency emissions.
The testing methodology involved measuring the power levels of emissions outside the designated operating frequency bands of the device. Spectrum analyzer plots are included, showing the emission levels across various frequency ranges. The results demonstrate that the NTNV-N78-3450-3550 device meets the required emission limits, indicating its suitability for certification and commercial use.
Detailed test configurations, including modulation schemes (DFT-QPSK), bandwidths, and antenna ports, are documented within the report. The testing was conducted under controlled laboratory conditions to ensure accuracy and repeatability. The data presented provides a comprehensive assessment of the device's out-of-band emission characteristics.
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