This document presents a detailed test report focusing on spurious emissions at the antenna terminals for various LTE FDD bands. The report includes spectrum analyzer plots and data for Bands 66, 71, and 85, covering different channel configurations (Low, Middle, High) and modulation schemes (BPSK, QPSK). The tests were conducted using a KEYSIGHT spectrum analyzer, and the results are presented in a clear and organized manner.
The report provides valuable insights into the emission characteristics of the tested devices, ensuring compliance with regulatory standards. The data includes frequency spans, reference levels, marker values, and other relevant parameters. The plots illustrate the spectral behavior of the emissions, allowing for a comprehensive assessment of the device's performance.
The test setup and procedures are described in detail, ensuring the reproducibility of the results. The report also includes information on the test equipment used, as well as the environmental conditions during the tests. This document serves as a valuable resource for engineers and technicians involved in the design, testing, and certification of LTE FDD devices.
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This document presents a detailed test report focusing on spurious emissions at the antenna terminals for various LTE FDD bands. The report includes spectrum analyzer plots and data for Bands 66, 71, and 85, covering different channel configurations (Low, Middle, High) and modulation schemes (BPSK, QPSK). The tests were conducted using a KEYSIGHT spectrum analyzer, and the results are presented in a clear and organized manner.
The report provides valuable insights into the emission characteristics of the tested devices, ensuring compliance with regulatory standards. The data includes frequency spans, reference levels, marker values, and other relevant parameters. The plots illustrate the spectral behavior of the emissions, allowing for a comprehensive assessment of the device's performance.
The test setup and procedures are described in detail, ensuring the reproducibility of the results. The report also includes information on the test equipment used, as well as the environmental conditions during the tests. This document serves as a valuable resource for engineers and technicians involved in the design, testing, and certification of LTE FDD devices.
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