This document presents the test results for the MTEB25030006-R device, focusing on dwell time and hopping channel characteristics. The tests were conducted to ensure compliance with regulatory standards for wireless devices operating in the 2.4 GHz band. The report includes detailed measurements and analysis of various modulation schemes, including GFSK, π/4DQPSK, and 8DPSK, across different packet types such as DH1, DH3, and DH5.
The dwell time measurements assess the duration for which the device occupies a specific channel, ensuring it remains within the permissible limits. The hopping channel analysis evaluates the device's ability to utilize the full spectrum by hopping between different channels. The results demonstrate that the device meets the required specifications for both dwell time and hopping channel, indicating its suitability for use in various wireless applications. The report includes graphical representations of the test data, providing a visual understanding of the device's performance under different operating conditions.
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This document presents the test results for the MTEB25030006-R device, focusing on dwell time and hopping channel characteristics. The tests were conducted to ensure compliance with regulatory standards for wireless devices operating in the 2.4 GHz band. The report includes detailed measurements and analysis of various modulation schemes, including GFSK, π/4DQPSK, and 8DPSK, across different packet types such as DH1, DH3, and DH5.
The dwell time measurements assess the duration for which the device occupies a specific channel, ensuring it remains within the permissible limits. The hopping channel analysis evaluates the device's ability to utilize the full spectrum by hopping between different channels. The results demonstrate that the device meets the required specifications for both dwell time and hopping channel, indicating its suitability for use in various wireless applications. The report includes graphical representations of the test data, providing a visual understanding of the device's performance under different operating conditions.
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