This document presents the FCC compliance test report for a wireless device, conducted by CVC Testing Technology (Shenzhen) Co., Ltd. The report, identified by number FCCSZ2025-0005-RF1-A1, details various tests performed to ensure the device meets FCC regulations. Key tests include DTS bandwidth measurement, maximum conducted output power assessment, and conducted spurious emission analysis.
The device was tested across different modes (11B, 11G, 11N20SISO, and 11N40SISO) and channels, with all test results indicating compliance with FCC limits. Specific measurements for DTS bandwidth, occupied channel bandwidth, maximum output power (peak and average), power spectral density, and band edge emissions are provided. The report includes detailed tables and graphs illustrating the test results, confirming that the wireless device successfully passed all required FCC tests.
Appendices cover DTS Bandwidth, Occupied Channel Bandwidth, Maximum Conducted Output Power, Maximum Power Spectral Density, Conducted Spurious Emission, Band Edge Measurements, and Duty Cycle.
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This document presents the FCC compliance test report for a wireless device, conducted by CVC Testing Technology (Shenzhen) Co., Ltd. The report, identified by number FCCSZ2025-0005-RF1-A1, details various tests performed to ensure the device meets FCC regulations. Key tests include DTS bandwidth measurement, maximum conducted output power assessment, and conducted spurious emission analysis.
The device was tested across different modes (11B, 11G, 11N20SISO, and 11N40SISO) and channels, with all test results indicating compliance with FCC limits. Specific measurements for DTS bandwidth, occupied channel bandwidth, maximum output power (peak and average), power spectral density, and band edge emissions are provided. The report includes detailed tables and graphs illustrating the test results, confirming that the wireless device successfully passed all required FCC tests.
Appendices cover DTS Bandwidth, Occupied Channel Bandwidth, Maximum Conducted Output Power, Maximum Power Spectral Density, Conducted Spurious Emission, Band Edge Measurements, and Duty Cycle.
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