This document presents a comprehensive test report from Shenzhen Huaxia Testing Technology Co., Ltd., focusing on RF conducted emissions. The report, identified by number CQASZ20250300543E-01, details tests performed to assess band-edge compliance and spurious emissions levels.
The tests were conducted according to 47 CFR Part 15C Section 15.247 (d) and ANSI C63.10:2013 standards. The report includes spectrum analyzer plots and tabular data showing the results of measurements taken across various frequency bands and modulation schemes. Specific attention is given to the DH5 and 2DH5 modes, with detailed analysis of emissions at the band edges and throughout the spectrum.
The report provides a thorough evaluation of the device's RF characteristics, ensuring compliance with regulatory limits. The test setup and methodology are clearly outlined, providing transparency and confidence in the results. The data presented supports the conclusion that the device meets the required standards for RF conducted emissions.
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This document presents a comprehensive test report from Shenzhen Huaxia Testing Technology Co., Ltd., focusing on RF conducted emissions. The report, identified by number CQASZ20250300543E-01, details tests performed to assess band-edge compliance and spurious emissions levels.
The tests were conducted according to 47 CFR Part 15C Section 15.247 (d) and ANSI C63.10:2013 standards. The report includes spectrum analyzer plots and tabular data showing the results of measurements taken across various frequency bands and modulation schemes. Specific attention is given to the DH5 and 2DH5 modes, with detailed analysis of emissions at the band edges and throughout the spectrum.
The report provides a thorough evaluation of the device's RF characteristics, ensuring compliance with regulatory limits. The test setup and methodology are clearly outlined, providing transparency and confidence in the results. The data presented supports the conclusion that the device meets the required standards for RF conducted emissions.
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