HAC T-coil test report 1 of 4
Microsoft Word 2016
tags: Array
(
[0] => Array
(
[url_sha] => a32065dbf67e7e49a632f55199706fa7d68372780d8eb15bf00e5db20a1234f1
[source] => fccid
[url] => https://apps.fcc.gov/eas/GetApplicationAttachment.html?id=3990630
[href_text] => HAC T-coil test report 1 of 4
[href_description] => Apple Inc. E3237A SMARTPHONE BCG-E3237A BCGE3237A e3237a
[http_status] => 200
[http_lastmod] => 0000-00-00 00:00:00
[http_contenttype] => application/pdf
[http_filename] => GetApplicationAttachment.html?id=3990630
[http_size] => 601444
[file_sha256] => ba214f8303c6ad3a3ecbd3d24f1532c5361e393691911ac4379ae2d3623c862a
[domain] => document.fccid
)
)
Array
(
[0] => Array
(
[id] => 3990630
[file_sha256] =>
[applicationId] => 0UHH6FaEZf5j23+dsKq8Ig==
[description] => HAC T-coil test report 1 of 4
[shortTermConfidential] => No
[permanentConfidential] => No
[supercede] => No
[exhibitType] => RF Exposure Info
[fileType] => Adobe Acrobat PDF
[displayType] => pdf
[fileSize] => 602549
[submissionDate] => 2018-09-04 00:00:00
[dateAvailable] => 2018-09-27 00:00:00
[creationDate] =>
[producer] =>
[modDate] =>
[title] =>
[creator] =>
[author] =>
[pages] =>
[realSize] =>
[html] => 0
[png] => 0
[txt] => 0
[version] => 0
[source] => 0
[fccId] => BCG-E3237A
[cleanFccId] => BCGE3237A
[exif] => 0
)
)