This document presents a comprehensive test report detailing the conducted band edge and spurious emission measurements performed by HUAK Testing. The tests were conducted to ensure compliance with FCC Part 15C Section 15.247(d) regulations. The test methodology followed the guidelines outlined in KDB558074 D01 15.247 Meas Guidance v05r02.
The report includes detailed test setups, procedures, and results for various operating modes, including transmitting mode with modulation. Spectrum analyzers, RF cables, and automatic control units were utilized for accurate measurements. The report provides a thorough analysis of the emissions, confirming that the RF fundamental frequency is excluded against the limit line in the operating frequency band. The test results indicate that the equipment under test (EUT) successfully passed the conducted band edge and spurious emission tests, meeting the specified limits.
This report serves as evidence of compliance and provides valuable insights into the emission characteristics of the tested device.
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This document presents a comprehensive test report detailing the conducted band edge and spurious emission measurements performed by HUAK Testing. The tests were conducted to ensure compliance with FCC Part 15C Section 15.247(d) regulations. The test methodology followed the guidelines outlined in KDB558074 D01 15.247 Meas Guidance v05r02.
The report includes detailed test setups, procedures, and results for various operating modes, including transmitting mode with modulation. Spectrum analyzers, RF cables, and automatic control units were utilized for accurate measurements. The report provides a thorough analysis of the emissions, confirming that the RF fundamental frequency is excluded against the limit line in the operating frequency band. The test results indicate that the equipment under test (EUT) successfully passed the conducted band edge and spurious emission tests, meeting the specified limits.
This report serves as evidence of compliance and provides valuable insights into the emission characteristics of the tested device.
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