This document showcases the radiated emission test setup conducted by Shenzhen CTB Testing Technology Co., Ltd. for model LC23001890. The images provide a visual representation of the testing environments used to assess the electromagnetic compatibility (EMC) of the device under test.
The document includes two distinct test setups: one for frequencies below 1 GHz (Below 1G) and another for frequencies above 1 GHz (Above 1G). These setups are designed to measure the unintentional electromagnetic radiation emitted by the device, ensuring it complies with relevant regulatory standards and minimizes interference with other electronic equipment.
The images highlight the shielded test chambers, antenna positioning, and equipment configuration used during the radiated emission testing process. These controlled environments are crucial for obtaining accurate and reliable measurements of the device's electromagnetic emissions.
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This document showcases the radiated emission test setup conducted by Shenzhen CTB Testing Technology Co., Ltd. for model LC23001890. The images provide a visual representation of the testing environments used to assess the electromagnetic compatibility (EMC) of the device under test.
The document includes two distinct test setups: one for frequencies below 1 GHz (Below 1G) and another for frequencies above 1 GHz (Above 1G). These setups are designed to measure the unintentional electromagnetic radiation emitted by the device, ensuring it complies with relevant regulatory standards and minimizes interference with other electronic equipment.
The images highlight the shielded test chambers, antenna positioning, and equipment configuration used during the radiated emission testing process. These controlled environments are crucial for obtaining accurate and reliable measurements of the device's electromagnetic emissions.
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