MPE Test Report
tags: Array
(
[0] => Array
(
[url_sha] => 749c1578497d52e4ee41792f168abe94819a3978d5dd7ca9614773d8d1cb53c1
[source] => fccid
[url] => https://apps.fcc.gov/eas/GetApplicationAttachment.html?id=6801363
[href_text] => MPE Test Report
[href_description] => Samsung Electronics Co Ltd MT6419-41A Base Station A3LMT6419-41A A3LMT641941A mt6419 41a
[http_status] => 200
[http_lastmod] => 0000-00-00 00:00:00
[http_contenttype] => application/pdf
[http_filename] => GetApplicationAttachment.html?id=6801363
[http_size] => 128151
[file_sha256] => 99565c04e15ed25a7f3316c48ff771f841cb17f08ae57de0580c7d840bae719d
[domain] => document.fccid
)
)
Array
(
[0] => Array
(
[id] => 6801363
[file_sha256] =>
[applicationId] => OgSzfMCxpKLyrZhzd3ECRg==
[description] => MPE Test Report
[shortTermConfidential] => No
[permanentConfidential] => No
[supercede] => No
[exhibitType] => RF Exposure Info
[fileType] => Adobe Acrobat PDF
[displayType] => pdf
[fileSize] => 128153
[submissionDate] => 2023-09-12 00:00:00
[dateAvailable] => 2023-09-12 00:00:00
[creationDate] =>
[producer] =>
[modDate] =>
[title] =>
[creator] =>
[author] =>
[pages] =>
[realSize] =>
[html] => 0
[png] => 0
[txt] => 0
[version] => 0
[source] => 0
[fccId] => A3LMT6419-41A
[cleanFccId] => A3LMT641941A
[exif] => 0
)
)