RF Exposure Evaluation
Microsoft Word 2016
tags: Array
(
[0] => Array
(
[url_sha] => b8bc56a9ba7379f7e922074e31205d834bb2c02396bf437d7fddc7d17695a153
[source] => fccid
[url] => https://apps.fcc.gov/eas/GetApplicationAttachment.html?id=3722437
[href_text] => RF Exposure Analysis
[href_description] => Silicon Laboratories Finland Oy MGM12P3 MGM12P3 802.15.4 module QOQMGM12P3 QOQMGM12P3 mgm12p3
[http_status] => 200
[http_lastmod] => 0000-00-00 00:00:00
[http_contenttype] => application/pdf
[http_filename] => GetApplicationAttachment.html?id=3722437
[http_size] => 104455
[file_sha256] => 9927a55653e5fe4204cf8010c41453dfafe540d4d8907c2e15f0b52e332e94ac
[domain] => document.fccid
)
[1] => Array
(
[url_sha] => 2fcf74f0c11e72f8d86d7e2f4568a98b96067b6d808ba9c0b93e2ec996a91f75
[source] => fccid
[url] => https://apps.fcc.gov/eas/GetApplicationAttachment.html?id=3490202
[href_text] => RF Exposure Evaluation
[href_description] => Silicon Laboratories Finland Oy MGM12P3 MGM12P2 802.15.4 module QOQMGM12P3 QOQMGM12P3 mgm12p3
[http_status] => 200
[http_lastmod] => 0000-00-00 00:00:00
[http_contenttype] => application/pdf
[http_filename] => GetApplicationAttachment.html?id=3490202
[http_size] => 104455
[file_sha256] => 9927a55653e5fe4204cf8010c41453dfafe540d4d8907c2e15f0b52e332e94ac
[domain] => document.fccid
)
)
Array
(
[0] => Array
(
[id] => 3490202
[file_sha256] =>
[applicationId] => xpPAJyNrc9yZcielQD+4lA==
[description] => RF Exposure Evaluation
[shortTermConfidential] => No
[permanentConfidential] => No
[supercede] => No
[exhibitType] => RF Exposure Info
[fileType] => Adobe Acrobat PDF
[displayType] => pdf
[fileSize] => 104455
[submissionDate] => 2017-07-31 00:00:00
[dateAvailable] => 2017-08-01 00:00:00
[creationDate] =>
[producer] =>
[modDate] =>
[title] =>
[creator] =>
[author] =>
[pages] =>
[realSize] =>
[html] => 0
[png] => 0
[txt] => 0
[version] => 0
[source] => 0
[fccId] => QOQMGM12P3
[cleanFccId] => QOQMGM12P3
[exif] => 0
)
)