This document is an FCC Part 15 Subpart C test report for a camera manufactured by Shenzhen Decheng Technology Co., Ltd. The report, referenced as CTA25042500601, details the testing performed to ensure compliance with FCC regulations for devices operating in the 2400-2483.5 MHz band.
The tests conducted include AC power conducted emission, radiated emission, maximum peak conducted output power, power spectral density, 6dB bandwidth, out-of-band emissions, and antenna requirement verification. The equipment under test (EUT) was identified as a camera, model H13B, with listed models XD and H9W. The testing was performed at Shenzhen CTA Testing Technology Co., Ltd. and the report was approved by RF Manager Eric Wang.
The report specifies the test standards used, including FCC Rules Part 15.247 and ANSI C63.10-2013. The results indicate that the EUT passed all tests, demonstrating compliance with the FCC's requirements for intentional radiators. The report also includes details on the test environment, equipment used, and measurement uncertainty.
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This document is an FCC Part 15 Subpart C test report for a camera manufactured by Shenzhen Decheng Technology Co., Ltd. The report, referenced as CTA25042500601, details the testing performed to ensure compliance with FCC regulations for devices operating in the 2400-2483.5 MHz band.
The tests conducted include AC power conducted emission, radiated emission, maximum peak conducted output power, power spectral density, 6dB bandwidth, out-of-band emissions, and antenna requirement verification. The equipment under test (EUT) was identified as a camera, model H13B, with listed models XD and H9W. The testing was performed at Shenzhen CTA Testing Technology Co., Ltd. and the report was approved by RF Manager Eric Wang.
The report specifies the test standards used, including FCC Rules Part 15.247 and ANSI C63.10-2013. The results indicate that the EUT passed all tests, demonstrating compliance with the FCC's requirements for intentional radiators. The report also includes details on the test environment, equipment used, and measurement uncertainty.
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