This document presents a comprehensive analysis of spurious emissions and frequency stability test results for various LTE bands and configurations. The tests were conducted using Keysight equipment, and the results are presented in a detailed, tabular format, accompanied by spectrum analyzer plots. The report covers a range of LTE bands, including Band 13 and Band 66, with varying bandwidths such as 1.4MHz, 3MHz, 5MHz, 10MHz, 15MHz, and 20MHz. Different modulation schemes, including QPSK and 16QAM, were employed during the tests.
The spurious emissions tests were performed to ensure that the device under test complies with regulatory limits for out-of-band emissions. The frequency stability tests were conducted to assess the device's ability to maintain a stable carrier frequency under varying temperature and voltage conditions. The results of these tests are crucial for verifying the device's compliance with regulatory requirements and ensuring its reliable operation in real-world scenarios. The report provides a detailed breakdown of the test setup, procedures, and results, offering valuable insights into the device's performance characteristics.
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The spurious emissions tests were performed to ensure that the device under test complies with regulatory limits for out-of-band emissions. The frequency stability tests were conducted to assess the device's ability to maintain a stable carrier frequency under varying temperature and voltage conditions. The results of these tests are crucial for verifying the device's compliance with regulatory requirements and ensuring its reliable operation in real-world scenarios. The report provides a detailed breakdown of the test setup, procedures, and results, offering valuable insights into the device's performance characteristics.
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