This document provides a visual overview of the test setups employed by Intertek for evaluating the electromagnetic compatibility (EMC) of a device. The images illustrate the configurations used for conducted emission, radiated emission (30MHz-1GHz and above 1GHz), and RF conducted tests. These tests are crucial for ensuring that the device meets regulatory requirements and operates without causing interference to other electronic equipment.
The conducted emission setup demonstrates the equipment arrangement for measuring unwanted signals conducted through power lines or other cables. The radiated emission setups show the device under test (DUT) positioned in an anechoic chamber, where antennas are used to detect radiated emissions across different frequency ranges. The RF conducted test setup highlights the direct connection of the DUT to test equipment for evaluating its radio frequency performance.
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This document provides a visual overview of the test setups employed by Intertek for evaluating the electromagnetic compatibility (EMC) of a device. The images illustrate the configurations used for conducted emission, radiated emission (30MHz-1GHz and above 1GHz), and RF conducted tests. These tests are crucial for ensuring that the device meets regulatory requirements and operates without causing interference to other electronic equipment.
The conducted emission setup demonstrates the equipment arrangement for measuring unwanted signals conducted through power lines or other cables. The radiated emission setups show the device under test (DUT) positioned in an anechoic chamber, where antennas are used to detect radiated emissions across different frequency ranges. The RF conducted test setup highlights the direct connection of the DUT to test equipment for evaluating its radio frequency performance.
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