This document presents the spurious emissions test report for the N78-3450-3550 PC2-30-80 device, conducted by Waltek Testing Group (Shenzhen) Co., Ltd. The tests were performed to ensure compliance with relevant certification standards. The report includes detailed measurements and analysis of spurious emissions across various frequency ranges, as depicted in the accompanying spectrum analyzer plots.
The tests cover a wide range of configurations, including different modulation schemes (DFT-QPSK), resource block allocations (1RB, Full), and antenna ports (Ant1). The frequency ranges examined span from 9 kHz to 40 GHz, with specific focus on in-band and out-of-band emissions. The plots illustrate the measured emission levels against frequency, with pass/fail indicators for each test case. The test setup and procedures are documented to ensure reproducibility and accuracy of the results. The report provides a comprehensive assessment of the device's spurious emission performance, demonstrating compliance with regulatory requirements.
Array
(
[0] => Array
(
[url_sha] => 21a0ba6c95c2d689729642ecff12d2286d16d1143c27faad5209c044262debce
[source] => fccid
[url] => https://apps.fcc.gov/eas/GetApplicationAttachment.html?id=8100225
[href_text] => WTX24X12303812W-N78-3450-3550 10
[href_description] => Shenzhen Qichang Intelligent Technology Co., Ltd DT3 Smart Tablet 2BAK2-DT3 2BAK2DT3 dt3
[http_status] => 200
[http_lastmod] => 0000-00-00 00:00:00
[http_contenttype] => application/pdf
[http_filename] => GetApplicationAttachment.html?id=8100225
[http_size] => 6000154
[file_sha256] => 7213b9cbd71874bbb64cf130bf000e4f09d769344615f0c2b647a9319f3d71eb
[domain] => document.fccid
)
)
Array
(
[file_sha256] => 7213b9cbd71874bbb64cf130bf000e4f09d769344615f0c2b647a9319f3d71eb
[cleanFccId] => 2BAK2DT3
[title] => N78-3450-3550 PC2-30-80 Test Report: Spurious Emissions
[description] => Spurious emissions test report for N78-3450-3550 PC2-30-80. Compliant with certification standards. Detailed analysis and results included.
[brand_name] => Waltek
[keywords] => ["N78-3450-3550", "PC2-30-80", "WTX24X12303812W", "N78-3450-3550 PC2-30-80"]
[intro] =>
This document presents the spurious emissions test report for the N78-3450-3550 PC2-30-80 device, conducted by Waltek Testing Group (Shenzhen) Co., Ltd. The tests were performed to ensure compliance with relevant certification standards. The report includes detailed measurements and analysis of spurious emissions across various frequency ranges, as depicted in the accompanying spectrum analyzer plots.
The tests cover a wide range of configurations, including different modulation schemes (DFT-QPSK), resource block allocations (1RB, Full), and antenna ports (Ant1). The frequency ranges examined span from 9 kHz to 40 GHz, with specific focus on in-band and out-of-band emissions. The plots illustrate the measured emission levels against frequency, with pass/fail indicators for each test case. The test setup and procedures are documented to ensure reproducibility and accuracy of the results. The report provides a comprehensive assessment of the device's spurious emission performance, demonstrating compliance with regulatory requirements.
)
Array
(
[0] => Array
(
[id] => 8100225
[file_sha256] =>
[applicationId] => SLWuMGQgBT7Wq0fu4M3RSQ==
[description] => WTX24X12303812W-N78-3450-3550 10
[shortTermConfidential] => No
[permanentConfidential] => No
[supercede] => No
[exhibitType] => Test Report
[fileType] => Adobe Acrobat PDF
[displayType] => pdf
[fileSize] => 6000156
[submissionDate] => 2025-03-06 00:00:00
[dateAvailable] => 2025-03-06 00:00:00
[creationDate] =>
[producer] =>
[modDate] =>
[title] =>
[creator] =>
[author] =>
[pages] =>
[realSize] =>
[html] => 0
[png] => 0
[txt] => 0
[version] => 1
[source] => 0
[fccId] => 2BAK2-DT3
[cleanFccId] => 2BAK2DT3
[exif] => 0
)
)