This document presents the frequency stability test results for the N78-3450-3550, conducted by Waltek Testing Group. The report details the frequency error versus voltage and temperature, providing a comprehensive analysis of the device's stability under varying conditions.
The tests were performed using DFT-QPSK and DFT-16QAM modulations across different channel bandwidths (10, 15, 20, 40, 50, 60, 70, 80, and 100) and RB configurations (Outer_Full). Voltage variations included VL, VN, and VH, while temperature ranged from -30°C to +50°C. The deviation in Hertz (Hz) and parts per million (ppm) was recorded for each test case, with a verdict of PASS indicating compliance with the required standards.
Detailed tables present the test results, including the band, SCS, modulation, channel, RB configuration, voltage, temperature, deviation in Hz, deviation in ppm, and verdict. The data provides a thorough assessment of the device's frequency stability performance.
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This document presents the frequency stability test results for the N78-3450-3550, conducted by Waltek Testing Group. The report details the frequency error versus voltage and temperature, providing a comprehensive analysis of the device's stability under varying conditions.
The tests were performed using DFT-QPSK and DFT-16QAM modulations across different channel bandwidths (10, 15, 20, 40, 50, 60, 70, 80, and 100) and RB configurations (Outer_Full). Voltage variations included VL, VN, and VH, while temperature ranged from -30°C to +50°C. The deviation in Hertz (Hz) and parts per million (ppm) was recorded for each test case, with a verdict of PASS indicating compliance with the required standards.
Detailed tables present the test results, including the band, SCS, modulation, channel, RB configuration, voltage, temperature, deviation in Hz, deviation in ppm, and verdict. The data provides a thorough assessment of the device's frequency stability performance.
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