LTE Test Report: 25B02W000004-001 - RF Performance

Test report LTE part10

This document presents a detailed test report (25B02W000004-001) focusing on the RF performance of an LTE device. The report, generated by the Chongqing Academy of Information and Communications Technology (CAICT), provides a comprehensive analysis of the device's transmission characteristics under various operating conditions.

The tests cover multiple frequency bands, including FDD66, FDD71, and TDD41, with a focus on 20MHz bandwidth configurations. The report examines the device's performance using both QPSK and 16QAM modulation schemes. Key metrics such as mean power, peak power, crest factor, and CCDF (Complementary Cumulative Distribution Function) are analyzed and presented graphically for each configuration.

The data presented in this report is crucial for assessing the device's compliance with regulatory standards and its overall performance in real-world deployment scenarios. The report also includes notes regarding the applicability of certain frequency ranges for specific certifications, such as IC certification.


File Info : application/pdf, 5 Pages, 2.95MB

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CAICT: 25B02W000004-001, LTE, FDD66, FDD71, TDD41, QPSK, 16QAM