This document presents a summary of testing performed by Waltek Testing Group on the N78-3450-3550 device, specifically focusing on PC2-30-15 and PC2-30-20 configurations with L and H designations, utilizing DFT-QPSK-O and DFT-QPSK-E modulations. The testing encompasses a wide frequency range, from 9 kHz to 40 GHz, to ensure compliance with regulatory standards. The report includes detailed spectrum analyzer plots showcasing conducted spurious emissions across various frequency bands. These plots provide visual evidence of the device's performance and adherence to specified limits.
The tests were conducted using Keysight spectrum analyzers, and the results indicate that the device meets the required standards for conducted spurious emissions. The report includes measurements for both outer full and edge configurations, covering different RB allocations. The data presented in this document is crucial for certification purposes and demonstrates the device's suitability for its intended application. The Waltek Testing Group's expertise ensures accurate and reliable testing, providing confidence in the device's compliance.
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The tests were conducted using Keysight spectrum analyzers, and the results indicate that the device meets the required standards for conducted spurious emissions. The report includes measurements for both outer full and edge configurations, covering different RB allocations. The data presented in this document is crucial for certification purposes and demonstrates the device's suitability for its intended application. The Waltek Testing Group's expertise ensures accurate and reliable testing, providing confidence in the device's compliance.
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