AutLet Test lab
JE-electronic Develop ineo 452
tags: Array
(
[0] => Array
(
[url_sha] => 21b9cbfb741df8e77892b541e8a456d7ff577290cba23c835ba9c8d04192aaa5
[source] => fccid
[url] => https://apps.fcc.gov/eas/GetApplicationAttachment.html?id=2689121
[href_text] => AutLet Test lab
[href_description] => JE electronic a/s JE784 Main terminal 2AE3QJE784 2AE3QJE784 je784
[http_status] => 200
[http_lastmod] => 0000-00-00 00:00:00
[http_contenttype] => application/pdf
[http_filename] => GetApplicationAttachment.html?id=2689121
[http_size] => 167957
[file_sha256] => 55075d3e506072fc914eb70ba9fbf51c8c170f7bbe486d4af13ab976857de139
[domain] => document.fccid
)
)
Array
(
[0] => Array
(
[id] => 2689121
[file_sha256] =>
[applicationId] => 8bUJy6nyI5dDs4DKWZLNlg==
[description] => AutLet Test lab
[shortTermConfidential] => No
[permanentConfidential] => No
[supercede] => No
[exhibitType] => Cover Letter(s)
[fileType] => Adobe Acrobat PDF
[displayType] => pdf
[fileSize] => 167957
[submissionDate] => 2015-07-23 00:00:00
[dateAvailable] => 2015-07-23 00:00:00
[creationDate] =>
[producer] =>
[modDate] =>
[title] =>
[creator] =>
[author] =>
[pages] =>
[realSize] =>
[html] => 0
[png] => 0
[txt] => 0
[version] => 0
[source] => 0
[fccId] => 2AE3QJE784
[cleanFccId] => 2AE3QJE784
[exif] => 0
)
)