This document presents comprehensive test data for LTE Band 2, focusing on conducted spurious emissions. The data includes detailed graphs and tables showcasing the results of various tests conducted under different configurations. The tests cover a range of bandwidths (1.4MHz, 3MHz, 5MHz, 10MHz, 15MHz, and 20MHz) and modulations (QPSK and 16QAM) across different channels. The results are presented in a clear and organized manner, allowing for easy analysis and interpretation.
The document includes spectrum analyzer plots illustrating the conducted spurious emissions at different frequency ranges. The tables provide a summary of the peak power levels and verdict (PASS/FAIL) for each test configuration. This information is crucial for assessing the compliance of the device with regulatory requirements and ensuring its proper operation within the specified frequency bands.
The test data presented in this document is essential for engineers and technicians involved in the design, testing, and certification of LTE devices. It provides valuable insights into the performance of the device and helps to identify any potential issues related to conducted spurious emissions.
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This document presents comprehensive test data for LTE Band 2, focusing on conducted spurious emissions. The data includes detailed graphs and tables showcasing the results of various tests conducted under different configurations. The tests cover a range of bandwidths (1.4MHz, 3MHz, 5MHz, 10MHz, 15MHz, and 20MHz) and modulations (QPSK and 16QAM) across different channels. The results are presented in a clear and organized manner, allowing for easy analysis and interpretation.
The document includes spectrum analyzer plots illustrating the conducted spurious emissions at different frequency ranges. The tables provide a summary of the peak power levels and verdict (PASS/FAIL) for each test configuration. This information is crucial for assessing the compliance of the device with regulatory requirements and ensuring its proper operation within the specified frequency bands.
The test data presented in this document is essential for engineers and technicians involved in the design, testing, and certification of LTE devices. It provides valuable insights into the performance of the device and helps to identify any potential issues related to conducted spurious emissions.
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