This document presents a visual overview of the test setups used for evaluating the electromagnetic compatibility (EMC) performance of a device. It includes photographs illustrating the configurations for radiated emission testing, both below and above 1 GHz, as well as the setup for conducted emission measurements. These tests are crucial for ensuring that the device complies with regulatory standards and does not cause undue interference to other electronic equipment.
The radiated emission setups demonstrate the positioning of the device under test (DUT) and the antenna used to measure the radiated electromagnetic fields. The conducted emission setup shows the DUT connected to a line impedance stabilization network (LISN) and a spectrum analyzer, which measures the conducted emissions on the power lines. Additionally, the document includes a setup for DFS (Dynamic Frequency Selection) testing, which is essential for devices operating in certain frequency bands to avoid interfering with radar systems.
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This document presents a visual overview of the test setups used for evaluating the electromagnetic compatibility (EMC) performance of a device. It includes photographs illustrating the configurations for radiated emission testing, both below and above 1 GHz, as well as the setup for conducted emission measurements. These tests are crucial for ensuring that the device complies with regulatory standards and does not cause undue interference to other electronic equipment.
The radiated emission setups demonstrate the positioning of the device under test (DUT) and the antenna used to measure the radiated electromagnetic fields. The conducted emission setup shows the DUT connected to a line impedance stabilization network (LISN) and a spectrum analyzer, which measures the conducted emissions on the power lines. Additionally, the document includes a setup for DFS (Dynamic Frequency Selection) testing, which is essential for devices operating in certain frequency bands to avoid interfering with radar systems.
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