SAR Test Report_Appendix B-Highest Test Plots
tags: Array
(
[0] => Array
(
[url_sha] => 57aa3845831b1aa057fd434a939d8773f07a0b6dac6719c78211f44aa9ce41b5
[source] => fccid
[url] => https://apps.fcc.gov/eas/GetApplicationAttachment.html?id=6421157
[href_text] => SAR Test Report_Appendix B-Highest Test Plots
[href_description] => Corsair Memory, Inc. RDA0047 2AAFMRDA0047 2AAFMRDA0047 rda0047
[http_status] => 200
[http_lastmod] => 0000-00-00 00:00:00
[http_contenttype] => application/pdf
[http_filename] => GetApplicationAttachment.html?id=6421157
[http_size] => 503594
[file_sha256] => 4865122e95668f6f1bc2304215bd6414c0bac962f8b1826f12012419b57a6b90
[domain] => document.fccid
)
[1] => Array
(
[url_sha] => 244aa0d3d75c5f802221dd0c839de5ea4073c66766f1e13eb6fc058032d0aaa5
[source] => fccid
[url] => https://apps.fcc.gov/eas/GetApplicationAttachment.html?id=6421004
[href_text] => SAR Test Report_Appendix B-Highest Test Plots
[href_description] => Corsair Memory, Inc. RDA0047 2AAFMRDA0047 2AAFMRDA0047 rda0047
[http_status] => 200
[http_lastmod] => 0000-00-00 00:00:00
[http_contenttype] => application/pdf
[http_filename] => GetApplicationAttachment.html?id=6421004
[http_size] => 503594
[file_sha256] => 4865122e95668f6f1bc2304215bd6414c0bac962f8b1826f12012419b57a6b90
[domain] => document.fccid
)
)
Array
(
[0] => Array
(
[id] => 6421004
[file_sha256] =>
[applicationId] => 9n/7s57Ph742TBDubb+E9A==
[description] => SAR Test Report_Appendix B-Highest Test Plots
[shortTermConfidential] => No
[permanentConfidential] => No
[supercede] => No
[exhibitType] => RF Exposure Info
[fileType] => Adobe Acrobat PDF
[displayType] => pdf
[fileSize] => 503595
[submissionDate] => 2023-03-17 00:00:00
[dateAvailable] => 2023-03-17 00:00:00
[creationDate] =>
[producer] =>
[modDate] =>
[title] =>
[creator] =>
[author] =>
[pages] =>
[realSize] =>
[html] => 0
[png] => 0
[txt] => 0
[version] => 0
[source] => 0
[fccId] => 2AAFMRDA0047
[cleanFccId] => 2AAFMRDA0047
[exif] => 0
)
)