Test Report BLE
tags: Array
(
[0] => Array
(
[url_sha] => 8d763588c05fb4094f1a1425a931116c7c1225e0a2a5b26d461a1fda1537ddd9
[source] => fccid
[url] => https://apps.fcc.gov/eas/GetApplicationAttachment.html?id=6864596
[href_text] => Test Report BLE
[href_description] => Lenovo (Shanghai) Electronics Technology Co., Ltd TB330XU O57TB330XU O57TB330XU tb330xu
[http_status] => 200
[http_lastmod] => 0000-00-00 00:00:00
[http_contenttype] => application/pdf
[http_filename] => GetApplicationAttachment.html?id=6864596
[http_size] => 3754170
[file_sha256] => 420b4b9673ce23256dd3480fc7daf6433d953e3de94ebce544822abe28e37bad
[domain] => document.fccid
)
)
Array
(
[0] => Array
(
[id] => 6864596
[file_sha256] =>
[applicationId] => +my2mw+piUE3Uh3l9vRr3g==
[description] => Test Report BLE
[shortTermConfidential] => No
[permanentConfidential] => No
[supercede] => No
[exhibitType] => Test Report
[fileType] => Adobe Acrobat PDF
[displayType] => pdf
[fileSize] => 3754172
[submissionDate] => 2023-10-18 00:00:00
[dateAvailable] => 2023-10-18 00:00:00
[creationDate] =>
[producer] =>
[modDate] =>
[title] =>
[creator] =>
[author] =>
[pages] =>
[realSize] =>
[html] => 0
[png] => 0
[txt] => 0
[version] => 0
[source] => 0
[fccId] => O57TB330XU
[cleanFccId] => O57TB330XU
[exif] => 0
)
)