This document presents detailed test data for LTE Band 4, focusing on spurious emissions and peak-average power ratio (PAPR). The tests were conducted by AIT and the report number is AiTSZ-240911024FW3. The document includes test results for various bandwidth configurations, including 1.4MHz, 3MHz, 5MHz, 10MHz, 15MHz, and 20MHz.
The spurious emission tests cover a wide frequency range, from 9 kHz to 17.55 GHz, and include both conducted and radiated measurements. The peak-average power ratio tests were performed to ensure compliance with regulatory limits. The document provides detailed information on the test setup, measurement procedures, and results. The test results are presented in both tabular and graphical formats, making it easy to assess the performance of the device under test.
The document also includes information on the equipment used for the tests, as well as the calibration dates. This information is important for ensuring the accuracy and reliability of the test results. The document is intended for use by engineers and technicians who are responsible for testing and certifying LTE devices.
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This document presents detailed test data for LTE Band 4, focusing on spurious emissions and peak-average power ratio (PAPR). The tests were conducted by AIT and the report number is AiTSZ-240911024FW3. The document includes test results for various bandwidth configurations, including 1.4MHz, 3MHz, 5MHz, 10MHz, 15MHz, and 20MHz.
The spurious emission tests cover a wide frequency range, from 9 kHz to 17.55 GHz, and include both conducted and radiated measurements. The peak-average power ratio tests were performed to ensure compliance with regulatory limits. The document provides detailed information on the test setup, measurement procedures, and results. The test results are presented in both tabular and graphical formats, making it easy to assess the performance of the device under test.
The document also includes information on the equipment used for the tests, as well as the calibration dates. This information is important for ensuring the accuracy and reliability of the test results. The document is intended for use by engineers and technicians who are responsible for testing and certifying LTE devices.
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