NTEK Test Report: EDR Band Edge and RF Spurious Emission Analysis

Test Report EDR pt. 2

This document presents a detailed test report focusing on the EDR (Enhanced Data Rate) performance of a wireless device. The report, generated by NTEK, specifically examines the band edge characteristics and RF spurious emissions to ensure compliance with regulatory standards. The tests were conducted under various configurations, including different modulation schemes (1-DH5, 2-DH5, and 3-DH5) and frequency bands (2402MHz, 2441MHz, and 2480MHz). The device was tested using a single antenna (Ant1) under both hopping and non-hopping modes.

The report includes comprehensive test graphs illustrating the measured power levels at the band edges and across a wide frequency spectrum to identify any spurious emissions. The results are presented in both graphical and tabular formats, providing a clear overview of the device's performance. The report also includes the measured values, limit values, and verdicts (Pass/Fail) for each test case, ensuring that the device meets the required specifications. The certification number associated with this report is #4298.01.


File Info : application/pdf, 25 Pages, 2.47MB

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NTEK: NVNT, 1-DH5, 2-DH5, 3-DH5, S25010803502001, Certificate #4298.01