RF Exposure
钛和检测认证集团股份有限公司
tags: Array
(
[0] => Array
(
[url_sha] => 544242d90463e7b7fb408c434c1f50ae9e8a0ee82dc538fdd286684c8f961de4
[source] => fccid
[url] => https://apps.fcc.gov/eas/GetApplicationAttachment.html?id=7182360
[href_text] => RF Exposure
[href_description] => Centrak, Inc. CTHSB760 BLE MultiMode Badge ST2-CTHSB760 ST2CTHSB760 cthsb760
[http_status] => 200
[http_lastmod] => 0000-00-00 00:00:00
[http_contenttype] => application/pdf
[http_filename] => GetApplicationAttachment.html?id=7182360
[http_size] => 443525
[file_sha256] => 302ce95088d92b3cbdd9f64ff60757b65ebea6e21e826f56cbc3cb08e02cf04f
[domain] => document.fccid
)
[1] => Array
(
[url_sha] => e808d8007b055ae455163017be655ea6921194b5d4addae096144e9f53c8027b
[source] => fccid
[url] => https://apps.fcc.gov/eas/GetApplicationAttachment.html?id=7182451
[href_text] => RF Exposure
[href_description] => Centrak, Inc. CTHSB760 BLE MultiMode Badge ST2-CTHSB760 ST2CTHSB760 cthsb760
[http_status] => 200
[http_lastmod] => 0000-00-00 00:00:00
[http_contenttype] => application/pdf
[http_filename] => GetApplicationAttachment.html?id=7182451
[http_size] => 443525
[file_sha256] => 302ce95088d92b3cbdd9f64ff60757b65ebea6e21e826f56cbc3cb08e02cf04f
[domain] => document.fccid
)
)
Array
(
[0] => Array
(
[id] => 7182360
[file_sha256] =>
[applicationId] => XNFZL+yv/sNz2vO5f70Bqw==
[description] => RF Exposure
[shortTermConfidential] => No
[permanentConfidential] => No
[supercede] => No
[exhibitType] => RF Exposure Info
[fileType] => Adobe Acrobat PDF
[displayType] => pdf
[fileSize] => 443526
[submissionDate] => 2024-03-18 00:00:00
[dateAvailable] => 2024-03-18 00:00:00
[creationDate] =>
[producer] =>
[modDate] =>
[title] =>
[creator] =>
[author] =>
[pages] =>
[realSize] =>
[html] => 0
[png] => 0
[txt] => 0
[version] => 0
[source] => 0
[fccId] => ST2-CTHSB760
[cleanFccId] => ST2CTHSB760
[exif] => 0
)
)