This document presents the test setup photos for the FLASH BADGER model, specifically focusing on radiated emission testing. The images showcase the testing environments used for both below 1G and above 1G frequency ranges. These photos provide a visual representation of the equipment configuration and setup used during the testing process, as conducted by Shenzhen CTB Testing Technology Co., Ltd.
The below 1G setup illustrates the placement of the device under test within the testing chamber, along with the positioning of the measurement antennas. Similarly, the above 1G setup demonstrates the testing arrangement for higher frequency emissions, including the use of specialized antennas and absorbers to ensure accurate measurements. These images are crucial for understanding the testing methodology and verifying the compliance of the FLASH BADGER model with relevant regulatory standards.
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The below 1G setup illustrates the placement of the device under test within the testing chamber, along with the positioning of the measurement antennas. Similarly, the above 1G setup demonstrates the testing arrangement for higher frequency emissions, including the use of specialized antennas and absorbers to ensure accurate measurements. These images are crucial for understanding the testing methodology and verifying the compliance of the FLASH BADGER model with relevant regulatory standards.
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