RF Exposure DTS


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tags:
Array
(
    [0] => Array
        (
            [url_sha] => 55e40e12f9d1e0ba214a02b757e10ba3ce9886baafa3c3a9cd986f163839d3b0
            [source] => fccid
            [url] => https://apps.fcc.gov/eas/GetApplicationAttachment.html?id=3983693
            [href_text] => RF Exposure DTS
            [href_description] => Microchip Technology Inc. A093167 SAM R34 Xplained Pro Evaluation Kit 2ADHKA093167 2ADHKA093167 a093167
            [http_status] => 200
            [http_lastmod] => 0000-00-00 00:00:00
            [http_contenttype] => application/pdf
            [http_filename] => GetApplicationAttachment.html?id=3983693
            [http_size] => 30969
            [file_sha256] => 18bf85b15d1f4f168584cf153343b49aa42e5d596579ef3268f80e1256cf6b87
            [domain] => document.fccid
        )

)
Array
(
    [0] => Array
        (
            [id] => 3983693
            [file_sha256] => 
            [applicationId] => S3DYvPrtQjKlqhvYy3MH1w==
            [description] => RF Exposure DTS
            [shortTermConfidential] => No
            [permanentConfidential] => No
            [supercede] => No
            [exhibitType] => RF Exposure Info
            [fileType] => Adobe Acrobat PDF
            [displayType] => pdf
            [fileSize] => 30971
            [submissionDate] => 2018-08-30 00:00:00
            [dateAvailable] => 2018-09-05 00:00:00
            [creationDate] => 
            [producer] => 
            [modDate] => 
            [title] => 
            [creator] => 
            [author] => 
            [pages] => 
            [realSize] => 
            [html] => 0
            [png] => 0
            [txt] => 0
            [version] => 0
            [source] => 0
            [fccId] => 2ADHKA093167
            [cleanFccId] => 2ADHKA093167
            [exif] => 0
        )

)