This document presents the test setup photos for the MOI-30X device, as tested by Shenzhen CTB Testing Technology Co., Ltd. The photos illustrate the configurations used for both radiated and conducted emissions testing. Radiated emissions testing was conducted in two frequency ranges: below 1 GHz and above 1 GHz. The photos show the device under test (DUT) positioned within the testing chamber, along with the associated measurement equipment.
The conducted emissions testing setup is also depicted, showcasing the DUT connected to the appropriate testing apparatus. These images provide a visual representation of the testing environment and setup, offering insights into the methodology employed to assess the electromagnetic compatibility (EMC) performance of the MOI-30X device. The document serves as a record of the testing procedures and configurations used to ensure compliance with relevant regulatory standards.
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This document presents the test setup photos for the MOI-30X device, as tested by Shenzhen CTB Testing Technology Co., Ltd. The photos illustrate the configurations used for both radiated and conducted emissions testing. Radiated emissions testing was conducted in two frequency ranges: below 1 GHz and above 1 GHz. The photos show the device under test (DUT) positioned within the testing chamber, along with the associated measurement equipment.
The conducted emissions testing setup is also depicted, showcasing the DUT connected to the appropriate testing apparatus. These images provide a visual representation of the testing environment and setup, offering insights into the methodology employed to assess the electromagnetic compatibility (EMC) performance of the MOI-30X device. The document serves as a record of the testing procedures and configurations used to ensure compliance with relevant regulatory standards.
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