Waltek Testing: Frequency Stability Test Report for N78-370

WTX24X12303812W-N78-3700-3800 12

This document presents the frequency stability test results for the N78-370, conducted by Waltek Testing Group (Shenzhen) Co., Ltd. The tests were performed under various voltage and temperature conditions to ensure compliance with regulatory requirements. The report includes detailed measurements of frequency deviation in Hertz (Hz) and parts per million (ppm) for different modulation schemes, bandwidths, and channel configurations.

The test setup involved varying the voltage levels (VL, VN, VH) and temperatures (-30°C to +50°C) while monitoring the frequency stability of the device. The results are presented in tabular format, showing the frequency deviation for each test condition. The modulation schemes used include DFT-QPSK and DFT-16QAM, with different RB configurations (Outer_Full). All test results indicate that the device passed the frequency stability requirements under the specified conditions.

The document also includes spectrum analyzer plots illustrating the out-of-band emissions and spurious emissions under different configurations. These plots provide a visual representation of the device's performance across a wide frequency range, ensuring that it meets the necessary emission standards.


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tags: ["WTX24X12303812W", "N78-370", "N78-3700-3800", "PC2-30-100-M-DFT-QPSK", "PC2-30-100-H-DFT-QPSK"]
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This document presents the frequency stability test results for the N78-370, conducted by Waltek Testing Group (Shenzhen) Co., Ltd. The tests were performed under various voltage and temperature conditions to ensure compliance with regulatory requirements. The report includes detailed measurements of frequency deviation in Hertz (Hz) and parts per million (ppm) for different modulation schemes, bandwidths, and channel configurations.

The test setup involved varying the voltage levels (VL, VN, VH) and temperatures (-30°C to +50°C) while monitoring the frequency stability of the device. The results are presented in tabular format, showing the frequency deviation for each test condition. The modulation schemes used include DFT-QPSK and DFT-16QAM, with different RB configurations (Outer_Full). All test results indicate that the device passed the frequency stability requirements under the specified conditions.

The document also includes spectrum analyzer plots illustrating the out-of-band emissions and spurious emissions under different configurations. These plots provide a visual representation of the device's performance across a wide frequency range, ensuring that it meets the necessary emission standards.

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