This document presents a comprehensive overview of the Bluetooth and BLE testing setups employed by JianYan Testing Group Shenzhen Co., Ltd. The document includes images and descriptions of both radiated spurious emission and conducted emission test configurations. The radiated spurious emission setup is shown for both below 1GHz and above 1GHz frequencies, detailing the equipment placement and testing environment.
The conducted emission setup is also illustrated, showcasing the equipment used for this type of testing. This document provides valuable insight into the testing procedures and equipment used to ensure the compliance and performance of Bluetooth and BLE devices. The project number associated with these tests is JYTSZR2411036.
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This document presents a comprehensive overview of the Bluetooth and BLE testing setups employed by JianYan Testing Group Shenzhen Co., Ltd. The document includes images and descriptions of both radiated spurious emission and conducted emission test configurations. The radiated spurious emission setup is shown for both below 1GHz and above 1GHz frequencies, detailing the equipment placement and testing environment.
The conducted emission setup is also illustrated, showcasing the equipment used for this type of testing. This document provides valuable insight into the testing procedures and equipment used to ensure the compliance and performance of Bluetooth and BLE devices. The project number associated with these tests is JYTSZR2411036.
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