This document presents the spurious emission test results for the N5 30kHz SISO configuration, as per the TCT250305E032 report. The testing covers various configurations, including different modulation schemes (DFT-S-OFDM QPSK, CP-OFDM QPSK), bandwidths (10MHz, 15MHz, 20MHz), and frequencies (829MHz, 831.5MHz, 834MHz, 836.5MHz, 839MHz, 841.5MHz, 844MHz). The tests were conducted to ensure compliance with regulatory limits for spurious emissions.
The report includes detailed graphs and tables summarizing the test results for different RB allocations (Edge_1RB_Left, Outer Full, Inner 1RB Left, Edge_1RB_Right, Inner_1RB_Right). Each test configuration is evaluated against specified limits, and the verdict (Pass/Fail) is provided. The document serves as a comprehensive record of the spurious emission performance of the N5 30kHz SISO configuration under various operating conditions.
The test setup and methodology are in accordance with industry standards, ensuring the reliability and accuracy of the results. This report is essential for demonstrating compliance and obtaining regulatory approvals for the device.
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[description] => Spurious emission test report for the N5 30kHz SISO. Includes test results and graphs for various configurations and frequencies.
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This document presents the spurious emission test results for the N5 30kHz SISO configuration, as per the TCT250305E032 report. The testing covers various configurations, including different modulation schemes (DFT-S-OFDM QPSK, CP-OFDM QPSK), bandwidths (10MHz, 15MHz, 20MHz), and frequencies (829MHz, 831.5MHz, 834MHz, 836.5MHz, 839MHz, 841.5MHz, 844MHz). The tests were conducted to ensure compliance with regulatory limits for spurious emissions.
The report includes detailed graphs and tables summarizing the test results for different RB allocations (Edge_1RB_Left, Outer Full, Inner 1RB Left, Edge_1RB_Right, Inner_1RB_Right). Each test configuration is evaluated against specified limits, and the verdict (Pass/Fail) is provided. The document serves as a comprehensive record of the spurious emission performance of the N5 30kHz SISO configuration under various operating conditions.
The test setup and methodology are in accordance with industry standards, ensuring the reliability and accuracy of the results. This report is essential for demonstrating compliance and obtaining regulatory approvals for the device.
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