Anbotek LTE-B2 Appendix Test Data: Conducted Spurious Emission

FCC-LTE-B2 Appendix Test Data_1-80

This document presents appendix test data for LTE-B2, focusing on conducted spurious emissions. The tests were conducted by Anbotek Product Safety, providing detailed results and analysis.

The report includes information such as the report number (1814C50039512501), test sample number (1-2-2), start and finish dates (2025-02-19 and 2025-04-29), and environmental conditions (temperature 24.3°C, relative humidity 57%, pressure 101 kPa). The tests were performed by Jokes Huang and audited by Justin Feng.

The appendix covers conducted output power and peak-to-average ratio (CCDF) measurements, with detailed test results for various bands, bandwidths, modulations, channels, and RB configurations. The data includes power levels in dBm and verdicts (PASS/FAIL) for each test case.

Additionally, the document provides test graphs and data related to 26dB bandwidth and occupied bandwidth, as well as band edge compliance. The information is intended to provide a comprehensive overview of the device's performance under various test conditions.


File Info : application/pdf, 80 Pages, 5.61MB

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Anbotek: LTE-B2, Conducted Spurious Emission, Appendix Test Data, 1814C50039512501